在分析现有纳米三坐标测量机结构的基础上，提出了一种新型的四面对称式桥架结构。
The new structure named symmetrical-bridge is developed based on the analysis of conventional Nano-CMMs.
根据给定的精度指标设计合理的精度分配方案，精度设计的结果满足纳米三坐标测量机的测量精度要求。
The reasonable error distributing design are done according to the given accuracy target and the result of accuracy design can meet the required measuring accuracy of the Nano-CMM.
本文分析了影响纳米三坐标测量机测量精度的误差源，建立了纳米三坐标测量机的误差模型，并针对不同的误差源提出了相应的误差分离方法。
This paper analyses the influences of every error source of the precision of CMM. Establish the error model of CMM, and design different method of error calibration for different error source.
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