材料的物理性质有助于确定哪一种波长的光可以被完全吸收，对于最初的硅器件来说，吸收点在近红外。
The physical properties of the material help determine which wavelengths of light will be perfectly absorbed; for the initial silicon device the sweet spot is in the near infrared.
采用近红外漫反射光谱技术对高硅氧/酚醛预浸布的树脂含量、挥发分含量和预固化度等质量指标进行了在线测定。
The resin content, the volatile content and the pre-curing degree of the silica/phenolic resin prepreg cloth were on-line determined by near infrared diffuse reflection spectrum.
介绍典型单片式非本征硅红外焦平面阵列的结构及性能参数。
The structure and performance parameters of typical monolithic non-intrinsic silicon IR focal plane array are presented.
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