采用随机数值模拟方法和功率谱密度函数生成随机轨道粗糙度。
The random rail roughness samples are yielded using random numerical method and power spectral density function.
提出一个利用多层膜小角X射线衍射谱衍射峰积分强度计算多层膜界面粗糙度的公式。
A simple formula for calculating the interfacial roughness of multilayer by using the small Angle X ray diffraction curves of the samples is given.
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