...堆叠层无法满足越来越严苛的要求， 例如众所皆知的传统 CVD 氮化矽含有大量的本体陷阱(Bulk Traps)及界面陷阱 (Interface Traps)， 此导致严重的可靠度问题及大量的 Frenkel-Poole 漏电流 (2-5) 。
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得到了阈值电压和比例差分峰值，界面陷阱密度和应力时间的关系。
The relationship between the threshold voltage and the peak of proportional difference, and between the interface trap density and stress time are also acquired.
“密码陷阱”指的是利用看似合法的界面诱骗使用者提供其密码的程序或网站。
Password trap is a program or website that USES a legitimate-looking interface to fool users into providing their passwords.
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