本文主要简述电路分析中基尔霍夫定律与电路尺寸之间的关系及应用范围。
This paper mainly gives the descinption of the relation and its application range between Kirchoff's Law and Circuit Dimension in analysing circuit.
测试表明，优化后的电路在读写距离、电路尺寸、抗干扰性等方面都优于原样机。
Testing results show that the optimized circuit is superior to the original prototype in reading, writing distance, circuit size, and interference.
在电路尺寸达到纳米量级的今天，设计与工艺的独立性被打破，引发了一系列可制造性设计问题与相关研究。
IC design and manufacturing are not independent any more, therefore a lot of design for manufacturability issues are caused.
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