在这些情况下，很小的温度差别就可能产生相当大的热电动势，足以影响测量的准确度。
In these cases, a small temperature difference may generate a large enough thermoelectric voltage to affect the accuracy of the measurement.
如果输入端的短路点具有很低的热电动势，用这种方法就可以验证输入噪声和零点随时间的漂移。
If the short circuit has a very low thermoelectric EMF, this can be used to verify input noise and zero drift with time.
VA和VB都受到热电动势漂移的影响，但是其对于VA和VB的影响是相等、相反的。
Both VA and VB are affected by the drift in the thermoelectric EMF, but the effect on VA and VB is equal and opposite.
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