x光衍射分析表明样品具有良好的晶体质量；
The perfect crystalline quality of PS films is verified by X-ray diffraction (XRD) and Raman spectroscopy.
在室温下的PL测量中见到了带边发射，其强度与晶体质量有关。
The band edge emission was observed in the PL spectra at room temperature. Its intensity was related to quality of the crystal.
拟合参量的进一步分析，可得出金刚石的晶体质量和金刚石薄膜中金刚石的含量。
With further analysis of fitted parameters, quality of diamond crystalline and diamond content in diamond films can be shown.
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