本文提出了产生数字电路测试码的一种算法——主路径敏化法。
This paper presents an algorithm of test patterns generation for digital circuits which is called the principal path sensitization method.
联机工作情况下对半导体随机存贮器的故障检测和诊断与一般的图案敏化法有显著的不同。
The method of testing semiconductor RAM in processes on-line condition is highly different from conventional pattern sensitive method.
分析了敏化活化一步法的优点，讨论了工艺条件对镀层结合力、镀层外观以及镍的沉积速度的影响。
The advantages of the above process were analyzed, and the influences of the process conditions on the deposit adhesion, appearance and deposition rate were discussed.
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