本文提出了产生数字电路测试码的一种算法——主路径敏化法。
This paper presents an algorithm of test patterns generation for digital circuits which is called the principal path sensitization method.
联机工作情况下对半导体随机存贮器的故障检测和诊断与一般的图案敏化法有显著的不同。
The method of testing semiconductor RAM in processes on-line condition is highly different from conventional pattern sensitive method.
本发明公开了一种具有超支化结构的高分子电阻型湿敏元件及其制作方 法。
The invention discloses a macromolecule resistance-typed humidity-sensitive element which has a hyperbranched structure and a manufacturing method thereof.
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