依据被测介质性质，在现有实验设备条件下，提出了一种标量法测量低损耗薄膜介质介电常数的新方法。
A new scalar method of measurement for low loss film medium is presented based on electric properties of measured medium under the present condition of laboratory.
对EOPCB的耦合接口方案进行了研究，针对直波导与多模光纤的耦合损耗进行了计算研究，为在实验过程中的具体操作提供了理论依据。
Then we will analyze the coupling blue print of EOPCB, and compute the loss of fiber coupling with optical waveguide, it will be useful in experimentation.
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