详细地分析了利用吉赫兹横电磁波室进行小体积受试设备（EUT）电磁场抗扰度测试的不确定度。

The uncertainty of electromagnetic field immunity test is particularly analyzed in this paper when it uses the GTEM for that small equipment under test(EUT).

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主要成果简述如下：1、提出了串扰型故障测试的基本原理。

Main achievements are summarized as follows: 1. Basic principles of crosstalk-induced fault testing were presented.

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超深亚微米工艺下，串扰的出现会导致在电路设计验证、测试阶段出现严重的问题。

Current design trends have shown that crosstalk issues in deep sub-micron can cause severe design validation and test problems.

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