激光扫描声学显微镜是一种新型的无损检测多层陶瓷电容器内部缺陷的测量技术。
The scanning laser acoustic microscope is a new type of nondestructive testing technique for detecting the internal defects of multilayer ceramic capacitors.
利用扫描电子显微镜(SEM)分析了阳极氧化后及产品失效后阳极钽芯表面介质膜的微观结构，并对液钽电容器失效机理进行了探讨。
The surface microstructure of anodic tantalum core was analyzed by scanning electron microscope (SEM), and then analyzed the failure mechanism of wet tantalum capacitor.
实验结果表明，对于同一个MOS电容器样品，从不同电压扫描率组合得到的产生寿命值基本一致。
The experimental results show that for the same MOS capacitor sample the obtained values of generation lifetime from varying association of voltage sweep rates are close each other.
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