自适应的扫描压缩方法在保证故障覆盖率的前提下，能够数十倍的减少测试矢量，进而减少测试所需时间，最终降低芯片成本。
With ensuring the fault coverage, the adaptive scan can be ten-fold reduction in the number of test vectors, thus reducing test time and ultimately reduce the cost of chip.
表2总结了此次表扫描的性能如何能从我们的两个设计决策中受益：原子站点分离和压缩。
Table 2 summarizes how the performance of this table scan query has benefited from two of our design decisions: atom site separation and compression.
DB 2行压缩功能可以减少磁盘存储需求，同时改进执行全表扫描的大量查询的顺序读取访问。
DB2 row compression features can decrease disk storage requirements while at the same time improve sequential read access of large queries which perform full table scans.
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