通过对序进应力加速寿命试验的研究，提出了一种快速评价微电子器件失效激活能的方法，建立了计算失效激活能的理论模型。

Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic device's activation energy is proposed, and the theory model is constructed.

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通过对序进应力加速寿命试验的研究，提出了一种快速评价半导体器件失效激活能的方法，建立了计算失效激活能的理论模型。

Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic devices activation energy is proposed, and the theory model is constructed.

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基于加速寿命试验原理，提出了一种简捷、实用的金属材料抗热冲击性能的快速对比试验方法。

A quick comparative test approach for the property in withstanding thermal impact of metal material is put forward.

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