简述了静态应力应变测量的基本方案，并对方案实施中的几个测量技术问题做了较详细的论述，给出了测量结果的一般分析方法。
Gives the basic scheme of static stress and deformation, and discuss some measure technology problem carefully, at last, supports the analysis-method of measure result.
当进一步对碎片施加应变，碎片的长度不再减少时，我们测量这个长度，并由此计算界面剪切应力。
The fragment length at which no more breaks occur when applying further strain to the specimen is measured and from this calculation of the interfacial shear stress is done.
本文以纳米压痕法结合量纲分析及有限元方法来测量薄膜材料的应力-应变关系。
In this master thesis, the stress-strain relationships of thin films were measured by nanoindentation combined with dimensional analysis and finite element method.
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