双列塑封的信号处理集成电路BY 139平均失效率达到10.8%,方形陶瓷封装的逻辑控制电路PC 11平均失效率达到2.5%。
The average failure rate of signal processing molectron BY139 was 10.8%. And the average failure rate of logical controlling molectron PC11 was 2.5%.
给出了分别以失效率、平均故障间隔时间表达的分配比例因子及分配公式。
The proportional allocation factor and the allocation formulae expressed in terms of failure rates and mean time between failures respectively are given.
本文讨论了材料退化失效的基本概念,给出了微观结构随机演化的动力学方程,统一导出了失效几率,可靠性、失效几率密度、失效率和平均寿命。
Some key concepts in degradated failure of materials is discussed. The stochastic evolution equation of defect clusters is given and the failure probability reliability and failure rate are derived.
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