对两种测量光纤折射半剖面的方法：干涉显微镜法和近区场法，进行了评价。
Two methods of measurement of the refractive index profile in optical fibers: interference microscope method and near field method are evaluated.
系统分别采用光流技术和显微干涉技术，结合频闪照明的方法，对MEMS器件的面内和离面运动特性进行了测量。
This system employed optical flow technology and microscopic interferometry combining with stroboscopic illumination to realize the measurement of in-plane and out-of-plane motions of MEMS devices.
同时给出了该方法原理性实验的观察结果，并与微分干涉显微镜的观察结果进行了对比。
In addition, the observed result of the theoretical experiment, and a comparison to the result from a differential interference microscope is also provided.
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