氦离子显微镜能够提供所有扫描射线法中最高空间分辨率的表面图像，以及极高的表面灵敏度。
Helium ion microscopy (HIM) offers the highest spatial resolution surface imaging of any scanning beam method, as well as extremely high surface sensitivity.
通过分析射线成像检测的数理模型，提出等效能谱透照成像方法，对探测器灵敏度进行校正。
The image method of equivalent energetic-spectrum is put forward, and applied in correcting the detector sensitivity by analyzing the mathematical model of X-ray radiography.
同步加速X射线衍射器灵敏度高，可对多晶型进行同时检测和定量。
The high sensitivity of SXRD allowed simultaneous detection and quantification of multiple crystalline phases.
应用推荐