用X射线双晶衍射仪扫描并分析了典型双势垒RTD样品的衍射摇摆曲线；
The results of double crystal X, ray diffraction measure of typical double barrier RTD material were given.
利用X射线双晶衍射分析了晶体的完整性。
The lattice perfection of the InAs single crystal is studied with X-ray diffraction.
文中还对多层膜的膜厚测量、X射线双晶衍射实验以及扫描电镜的表面象和剖面象进行了分析。
Film thickness measurements, bicrystal X-ray diffraction experiments and surface and cross-sectional micro-photographs taken by S. E. M. for epitaxial films are also discussed.
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