对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨，提出应用二维零位标记进行漂移测量。
Several quantitative drift measurement techniques for scanning probe microscopy (SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.
利用光学显微镜、扫描电镜、定量金相等技术研究了冷却速度、铅含量、重力作用等对铝铅合金显微组织的影响。
The effects of cooling velocity, the lead content and the gravity on the microstructures of Al Pb alloy were discussed based on the results of optical microscope, SEM and quantitative metallography.
用扫描电子显微镜(SEM)对粉料及微波合成的块体样品表面进行物相分析和元素的半定量分析。
Scaning electronics microscopy (SEM) was applied hereby to surface phase and elements analysis of the powder by precursor method and grain sample by microwave method.
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