该扫描路径上的延迟减少对外部缓冲器的需求，进而在集成电路扫描测试时避免保持时间违反。
The delay in the scan path reduces the need for external buffers to avoid hold-time violations during scan testing of integrated circuits.
这些缓冲区可以是程序描述的，也可以是外部描述的。
These buffers can be program-described or externally-described.
任何允许外部实体来输入数据的程序都容易受到恶意的攻击，例如缓冲区溢出和嵌入式控制字符。
Any program that allows an external entity to input data is vulnerable to malicious activity, such as buffer overflows and embedded control characters.
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