台阶仪属于接触式表面形貌测量仪器。如下图所示： 为一典型台阶仪外观图，包括台阶仪本体、隔振台、打印机、电脑等。
用XRD，红外吸收光谱，台阶仪对薄膜进行分析和测量。
The films were analyzed and measured by XRD, infrared spectra, a-step device.
借助台阶仪、X射线衍射(XRD)、扫描电镜(sem)等手段对颗粒硅带及多晶硅薄膜进行了表面轮廓、结晶质量和微观形貌的表征。
The surface profiles, micro-morphologies and crystal quality of SSP ribbon and Poly-Si film were then investigated by the step profiler, XRD (X-ray Diffraction) and SEM (Scanning Electron Microscopy).
改进记录仪功能，充分发挥其效能，使地震采集更上一个新台阶。
To improve the function of foe plotter can make seismic acquisition quality up to a new level.
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