前言： 对用电子显微镜测量薄膜厚度的三种方法：双束衍射法、污斑法、污线法进行了实验及比较分析。
The experiments , comparison and analysis for the three thickness measurement methods :two-beam diffraction method , contamination spot method and contamination line method were carried out.
根据光的衍射原理和莫尔图像编码原理，实现了无钥匙位相型双图像莫尔编码技术。
According to the theory of light diffraction and that of moire image encoding, a new technology of double image encoding using non key phase only moire method is presented in this paper.
理论研究表明，在经过圆形光阑的夫琅和费衍射实验和杨氏双缝干涉实验中，衍射光场的归一化光谱都发生了剧烈的变化。
The theoretical analyses show that the phenomena of drastic spectral changes were also found in Fraunhofer diffraction of a circular aperture and Young's double-slit interference experiments.
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