基于微电子测试双桥结构，本文给出了缺陷特征参数提取方法。
Based on the double bridge structure of microelectronics test pattern, the method of defect model parameter extraction is presented in this paper.
研究了基于微电子测试的双桥结构图形，功能成品率模型参数提取的优化方法。
Then, based on the double bridge test structure, an optimization method is presented which is used to extracting the parameters of yield model fast and effectively.
该开关的结构特点是，以共面波导上的悬空金属膜为双桥结构，并且膜桥的支撑呈折叠弹簧结构。
The switch consists of two suspended metallic membranes supported by a serpentine flexible spring over a coplanar waveguide.
应用推荐