用光谱式椭偏仪对薄膜的厚度进行了测试。

The thicknesses of the thin films are measured by spectroscopic ellipsometer.

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探讨眼前段光学相干断层扫描仪（AC-OCT）测量中央角膜厚度（CCT），并与光学相干断层扫描仪（OCT）进行比较。

To investigate the difference of central corneal thickness(CCT) measured by optical coherence tomography(OCT), anterior chamber-optical coherence tomography(AC-OCT), and compare their repeatability.

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计算表明：应用渡越光栅谱仪选择合适的膜片厚度及间距，对于给定的电子能谱，可以得到大的能量接受度和好的能量分辨率。

Calculation shows that large energy acceptance with good resolution can be achieved for given electron spectrum by proper selection of foil thickness and spacing when using TRG spectrometer.

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