This paper studies the ATPG algorithms which use satisfiability(SAT) solver as the search engine. The contents are outlined as following:First, the ATPG algorithm for single stuck-at faults of bincomational circuit is presented and implemented.
本论文以布尔可满足性算法作为基础,从下面三个方面对测试向量自动生成算法进行了研究:首先提出并实现了针对组合电路单固定型故障的测试向量生成算法。
参考来源 - 基于SAT的VLSI测试向量自动生成技术·2,447,543篇论文数据,部分数据来源于NoteExpress
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