用原子力显微镜（AFM）研究了剪切带的三维形貌。
Three-dimension pattern of shear bands was investigated using atom force microscopy(AFM).
应用“禁戒光”近场光学显微镜可同时获得三幅图像，即允许光像、禁戒光像和反映样品表面形貌的剪切力图像。
The new "forbidden"nearfield optical microscope can obtain three images simultaneously, namely shear force image, forbidden light image and allowed light image.
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