提出了一种新的动态启发式二叉判定图(BDD)最小化算法。

A new dynamic heuristic binary decision diagram (BDD) minimization algorithm is proposed.

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本文利用二叉判定图提出了对功能级数字电路的一种测试产生方法。

Using Binary Decision Diagrams, this paper proposes a test generation method for functional level digital circuits.

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在逻辑验证和综合中，布尔匹配利用有序二叉判定图obdd来检验两个给定的逻辑函数是否相等。

In logic verification and logic synthesis, Boolean matching is widely used to testify whether two given functions are logically equal by means of OBDD.

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