低能电子碰撞原子内壳层电离截面测量的研究在理论和实际应用方面都具有重要意义。
The study of atomic inner-shell ionization cross-sections by low-energy electron impact is significant in both theoretical researches and practical applications.
本文利用R -矩阵方法对部分原子和离子的价壳层、内壳层光电离过程进行了较详细的研究。
The photoionization of atoms and ions are studied theoretically by using the R-matrix method in this thesis.
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