光发射电子显微镜 PEEM ; Photoemission electron microscopy
光电子发射显微镜 X-ray Photo-Electron Emission microscope
光学电子显微镜 Optics Electronic Microscope
光发射电子显微镜检查 photo-emission electron microscopy ; emission Electron Microscopy
光电发射电子显微镜 PEEM
相关光学和电子显微镜 CLEM
用扫描电子显微镜(sem)和X射线光电子能谱仪(XPS)对钢球磨损表面进行了分析。
The worn surfaces of the steel balls were analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS).
采用扫描电子显微镜(sem)、X射线光电子能谱仪(XPS)、傅立叶红外光谱仪(IR)对盘上磨痕进行表面分析。
The surface of the wear scar was analyzed by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Fourier infrared spectroscopy (IR).
并利用扫描电子显微镜(sem)和x -射线光电子谱(XPS)对薄膜的形貌和组分进行了表征。
The surface morphology and the component of the film has been analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectrometer (XPS).
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