实验结果与光学方法所得结果相一致，但在判明位错的性质方面，X射线形貌术有其独特的优点。
Some experimental results are consistent with the results obtained by optical methods, however, X-ray method has its special advantage in discriminating the properties of dislocations.
与位错核心相联系的悬空键在很大程度上决定着位错的光学电学性质。
The dangling bonds associated with the dislocation core determine to a large extent the electrical and optical properties of the dislocations.
在薄膜中的螺旋位错强烈地影响YBCO的性质。
The screw dislocation in the film strongly influences the properties of the YBCO.
应用推荐