在实验数据计算中，考虑了二次荧光的贡献，忽略了三次荧光强度。
In the calculation of the experimental data, the secondary fluorescent X-ray intensity was considered with the tertiary neglected.
为了弥补目前采用的各种镀层厚度测量方法之不足，本文提出利用镀层元素一次X光激发的基底金属二次荧光进行膜厚测量的设想，并推导出相应的计算公式。
A suggestion was made to measure thin-film thicknesses using second X-ray fluorescence from substrate excited by primary X-ray of plating element, and corresponding equations were derived.
“基因包”里包含有经修饰过的基因，并且能够让生物体重复利用氧化荧光素，这种次级代谢产物还可以用于二次发光。
The package includes genetic modifications to enable organisms to recycle oxyluciferin, the by-product of the reaction that produces light.
应用推荐