这些微晶是一种叫作磷化铟的半导体化合物，它们被喷撒在一张透明塑料薄片上，然后用另一张薄片盖好。
The dots, composed of a semiconductor called indium phosphide, are sprayed onto a transparent plastic sheet that is then covered with a second sheet.
一种是氧化锡铟。
本文提出了半导体锑化铟单晶位错显示中对样品处理的一种新方法，并通过大量的实验证实了这种方法的可行性。
The paper presented a new method for sample treatment in semiconductor indium antimonide single crystal dislocation display, and proveded of feasibility this method with large number experiments.
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