The failure of the powder metallurgy valve seat was analyzed by optical microscopy, scanning electronic microscopy, X-ray energy spectrum and X-ray diffraction.
采用力学、物理性能测试，金相、扫描电镜、能谱和X衍射分析研究了气门座圈产品失效的主要原因。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .
用x射线衍射（XRD）、扫描电镜（SEM）和x光电子能谱（XPS）对样品进行了结构、形貌及组分分析。
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