... X-ray diffractometry X射线衍射学 X-ray electron spectroscopy X射线电子能谱学 X-ray energy spectrometer X射线能谱仪 ...
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X-ray photo electron spectroscopy X 射线光电子能谱法
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
Then their structures and composing are analyzed by Fourier transform infrared spectroscopy(FT-IR), X-ray diffraction(X-RD), scanning electron microscopy(SEM).
红外光谱、X-射线衍射、扫描电镜分析其结构与组成,对膜进行降解性、溶涨性和兔眼生物相容性实验研究。
We utilized the electrochemistry, scanning electron micrograph, X-ray fluorescence spectroscopy and X-ray photoelectron spectroscopy to demonstrate this mechanism.
我们用电化学方法、扫描电镜、X射线光电子能谱和X射线荧光光谱法对此进行了证明。
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