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wafer test

  • 晶圆测试:一种在半导体制造过程中对晶圆上的集成电路进行测试的方法,以检查其性能和可靠性。

网络释义英英释义

短语

automatic wafer testing machine [自] 自动圆片测试机

automatic c wafer testing machine 自动圆片测试机

wafer-level testing 圆片级测试

wafer acceptance testing 晶圆允收测试

Wafer Level Burn-in Testing 晶圆等级预烧测试

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Wafer testing

  • abstract: Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test patterns to them.

以上来源于: WordNet

双语例句

  • During the testing of the integrated circuit (404), it communicates in the wafer test mode.

    集成电路(404)测试过程中,晶片测试模式下通信

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  • Test wafer - a silicon wafer that is used in manufacturing for monitoring and testing purposes.

    测试圆片-用于生产监测测试的晶圆片。

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  • Finally, this paper primarily establishes a testing method of characterization silicon carbide wafer quality.

    最后初步确立表征碳化硅单晶抛光片质量测试方法

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