A method for rapidly determining long generation lifetime under linear voltage sweep was presented.
本文提出了线性电压扫描下长产生寿命的快速测量方法。
Measuring the reverse bias current of an APD requires an instrument that can measure current over a wide range as well as output a voltage sweep.
测量APD的反向偏置电流需要一种能够在很宽范围内测量电流并且能输出扫描电压的仪器。
An experimental method to determine minority carrier generation lifetime from the values of saturation capacitance under two different voltage sweep rates has been presented.
本文建议子一种由两个不同电压扫描率下的饱和电容值确定产生寿命的实验方法。
应用推荐