Influence of discharge parameters such as RF power and working pressure on the negative self-bias voltage of substrate was investigated by an oscilloscope with a high voltage probe.
采用高压探头示波器系统研究了射频辉光放电参数对自偏压的影响规律。
Scanning tunneling microscope (STM) work by the voltage added to the microscope probe tip and the ends of the scanned object and then detect current changes.
扫描隧道显微镜(STM)的工作方式是把电压加到显微镜探头尖端与被扫描物体这两端，然后检测电流变化。
In this work, the peak value of magnetization dependence of stress can be obtained directly by integrating the inductive voltage of magnetic probe.
本工作将探测到的感生电压积分，直接获得磁感强度峰值与待测应力的函数关系。
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