The plane, carrying around 60 people, was travelling at a "very lowspeed" on the Heathrow runway when the flight was aborted, according to a BA spokeswoman.
The test chip will enable the correlation of the simulation models to the FinFET process and contains test structures, standard cells, a PLL and embedded SRAMs. The memory instances include high-density SRAMs designed to operate at verylow voltages and high-speed SRAMs to validate the process performance.