Since 1970s China has successively developed TYZ type and AT type raise borers and achieved remarkable results in raise boring.

我国从七十年代以来，相继研制成功了TY Z型和AT型天井钻机，在天井钻进中取得了显著的效果。

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Through the experiment with the circuits thermal drift, of TYZ-3 intelligent soil nutrition gauge, J-type field effect transistor(JFET) was found as the major cause of circuits thermal drift.

本文简要综述了国内外的电路温度补偿方法，对TYZ-3智能型土壤养分测试仪的温度漂移进行了试验研究。

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