Total reflection X-ray fluorescence analysis 全反射X射线荧光分析
The advances, principles, Instruments and applications of total reflection X-ray fluorescence spectrometry are reviewed with 67 references.
本文综述全反射x -射线荧光光谱分析的进展、原理、仪器和应用。参考文献67篇。
The experimental instrument, sample preparation and determination method of the trace element Se in solution by total reflection X-ray fluorescence analysis are described in this paper.
本文叙述了用全反射X荧光分析方法测定溶液中微量硒的实验装置、制样技术和测定方法。
The sensitivity of total reflection X ray fluorescence analysis (TXRF) is higher than normal X ray fluorescence analysis (XRF).
全反射荧光分析(TXRF)比常规荧光分析(XRF)具有更高的灵敏度。
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