She derived another formula relating the number of folds possible in one direction (n) to the minimum possible length of material (l) and the material's thickness (t)
她推导出了另一个关于折叠次数（n）、现实的最小长度（l）以及材料厚度（t）的关系式。
Rutherford backscattering spectrometry (RBS) demonstrates that the concentration of Fe or N atoms varies gradually from the substrate to the surface through the whole thickness of the films.
卢瑟福背散射分析结果表明，铁、氮两种原子的密度沿膜厚度方向呈梯度变化。
Through analyze, we consider the P-N junction temperature, the concentration of phosphor, the thickness of the coating as the main reason for these electric-light-color parameters changes.
通过分析，发现P - N结的温度、荧光粉浓度与其涂覆的厚度是影响这些光色电参数变化的主要原因。
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