This paper presents a hardware structure-independent weight-based fault injection model for accurate emulation of the radioresistance in the SRAM-based FPGA.
提出一种与具体硬件结构无关、基于权重的错误注入模型,用于准确模拟基于SRAM的现场可编程门阵列抗辐射性能。
Based on magnetic induction and EMT technology, the EMT system based on FPGA has been developed and a measuring model has been built.
本课题设计了基于FPGA的电磁层析成像系统并搭建了系统测量模型。
To deal with the hierarchical FPGA architectures, a modified partitioning algorithm was introduced here according to special hierarchical FPGA model based on the previous works.
为了处理层次化FPGA结构,本文在前人划分工作的基础上,针对特定的层次化FPGA模型,提出了一种改进的划分算法。
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