To solve this problem, a new scheme to test the capacity of MCU is put forward in this paper.
本论文就是针对这个问题,提出了一种测试MCU容量的方案。
The scheme discussed in this paper solves this problem. It is a new method to test the capacity of MCU, which breaks the conventional one.
文中,重点介绍了测试设备的设计和实现,以及利用该测试设备测试MCU容量时的具体步骤。
The penetrameter test data that may be directly transposed to estimate the bearing capacity of the shallow footings.
可直接将渗透试验数据转换为浅层地基承载力的估算方法。
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