Methods and computer readable media for performing scan-based testing of circuits using one or more test clock control structures are disclosed.

公开了使用一个或多个测试时钟控制结构的来执行基于扫描测试的方法和计算机可读介质。

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In various embodiments, the method can include configuring different programmable test clock controllers to test different domains substantially in parallel.

在各个实施例中，该方法可包括配置不同的可编程测试时钟控制器来基本上并行地测试不同域。

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Back on Earth, space scientists and engineers worked around the clock to design and test new ideas to help the astronauts survive.

VOA: special.2009.07.22

Crump claims it will run glitch-free for 3, 000 hours--a sixfold improvement over the original Genisys--based on a test involving 22 machines running round the clock for two years.

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To win the cash, the remaining contestant will join forces with both celebrities for the final round, which will test their sketching skills against a 90 second clock.

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