Methods and computer readable media for performing scan-based testing of circuits using one or more test clock control structures are disclosed.
公开了使用一个或多个测试时钟控制结构的来执行基于扫描测试的方法和计算机可读介质。
In various embodiments, the method can include configuring different programmable test clock controllers to test different domains substantially in parallel.
在各个实施例中,该方法可包括配置不同的可编程测试时钟控制器来基本上并行地测试不同域。
It seems to me that a compromise would be receiving the exam questions a day or two in advance, and then doing the actual test in class the ticking clock overhead.
在我看来,一个折衷的办法是提前一两天收到考题,然后在课堂上计时做实际的测试。
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