automatic test paper generation 自动组卷 ; 智能组卷
test paper generation system 组卷系统
Automatic Test Paper Generation System 自动成卷系统
Using Binary Decision Diagrams, this paper proposes a test generation method for functional level digital circuits.
本文利用二叉判定图提出了对功能级数字电路的一种测试产生方法。
In addition, the detailed analysis of some frequently used memory test algorithms and brief analysis of some test generation algorithms for VLSI are also included in this paper.
另外本文还比较详细的分析比较了常用的存储器测试算法，简要分析了VLSI测试生成算法。
This paper presents an interoperability test generation method based on the formal model, Communicating Multiport Finite State Machines.
文章提出了一种基于通信多端口有限状态机模型的协议互操作性测试生成方法。
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