Tapping Force Curve 轻敲力曲线
Peak force tapping 峰值力轻敲模式
tapping axial force 攻丝轴向力
Tapping ModeAtomic Force Microscopy 式原子力显微镜
Tapping mode atomic force micrcscopy 敲击式原子力显微镜
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Based on the analysis of tapping force system and characteristic of chip removal, it is confirmed that radial force, axial force and jam of chip removal are the main reasons for poor thread quality.
通过对攻丝切削力和丝锥排屑特点的分析，确定径向力、轴向力和排屑不畅是影响攻丝质量的主要因素。
Working at tapping mode, atomic force microscope(AFM) piezoelectric microcantilever vibrates with large amplitude.
在轻敲工作模式下，原子力显微镜（AFM）压电微悬臂以较大的振幅振动。
Random tapping with varying force and speed is used to stir and smooth the meridians.
用不同的力和速度来进行随意的敲击是用来刺激和舒缓经脉的。
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