The depth of cracks on the silicon sample subsurface corroded was measured by a scanning electron microscope.
用扫描电子显微镜观察和测量腐蚀后硅样品的亚表面裂纹。
Combination of these logs, supported by plotted sample description, are used in establishing precise subsurface stratigraphic correlations.
现在综合应用这些测井方法，再结合岩样描述，进行精确的地下地层对比。
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