By comparing the two step testing of both static and dynamic, we can realize the off line debugging of the submodular circuit board.
采用静态和动态两步测试比较，可以实现子模块电路板的脱机调试。
The problem of maximizing a submodular set function with multiple constraints is considered, which has important application in combinatorial optimization theory.
提出了多维约束下下模函数最大值问题，分析其在组合优化中的重要应用。
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