The test vectors of some sub-scan chains generate by controllable LFSR when these chains only need to update test vector and do not need to shift out test responses.
当某个子扫描链的测试向量需要更新且又不需要移出其测试响应时，其测试向量由可控LFSR产生。
In treating with a chip scan picture, adopt sub-picture segmentation and separateness disposal mode.
在芯片扫描图的信息处理中采用了子图分割和单独处理方式。
IEEE1149 standard and its. X sub standards are based on boundary scan technique, different standards can be appropriately selected for various of applications.
IEEE1149标准及其子标准是基于边界扫描的测试技术，它们针对不同的应用环境采用相应的技术标准。
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