sub-aperture stitching interferometry 子孔径干涉拼接测量
Sub-aperture stitching, characterized by extending lateral and longitudinal dynamicranges of interferometry, is an important technique for measuring large aperature opticalcomponents with high resolution, high precision and at low cost.
子孔径拼接检测技术是拓展标准干涉仪的横向和纵向动态范围，实现低成本、高分辨率检测大口径光学元件的有效手段。
参考来源 - 大口径光学平面干涉检测的子孔径拼接研究·2,447,543篇论文数据，部分数据来源于NoteExpress
Sub-aperture stitching technology can help optical system fulfill the requirements of large aperture, light weight and collapsible.
这样的拼接式光学系统能够满足大口径、轻重量和可以折叠的要求。
The principle was discussed. Testing the model of sub-aperture stitching were established. According to the basic theory of least-squ, a program was designed for it.
讨论了子孔径拼接的基本原理，建立了子孔径拼接模型，确定了进行长平晶拼接测试的基本算法。
Optimal stitching algorithm is extremely important for testing large-aperture aspherical optical elements by annular sub-aperture scanning technique.
优化的拼接算法是环形子孔径扫描测量大口径非球面光学元件的关键问题。
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